Cleanliness Analysis - Ion Chromatography (Full Board and Localized)

Ion Chromatography (Full Board and Localized)

Ion chromatography characterizes and quantifies specific residue species present on samples. Performed in accordance with the latest IPC standards, ZESTRON offers both “full” board and localized” spot extraction techniques to identify the presence of undesired ionic materials.  The testing can be performed on bare PCBs components and fully populated PCBAs.  Identifying ionic residues and understanding trouble areas will lead to improved product quality.

"Full" Board Extraction Technique

“Full” board extraction provides the average of all ionic contaminants present on the board surface.  The goal of using “full” board extraction is to provide an analysis of the ionic species on the board surface and assess its overall cleanliness level. It is one of the most widely used test methods in the electronics industry to quantitavely identify and measure ionic (anions, cations, WOAs) specifies present on the board surface that could ultimately lead to in-field board failures.

"Localized" Spot Extraction Technique

“Localized” extraction, unlike “full” board extraction, targets critical areas of concern (0.1 in2) on the board surface to assess cleanliness levels.  It can be used to perform electrical tests that provide immediate “clean” or “dirty” readings for ionic contamination.  Additionally, the extracted sample can be subjected to IC testing to quantify ionic residues.  Therefore, “localized” ion chromatography can be tailored to individual test points for further investigation of ionic contamination within targeted troublesome areas.

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