electrochemical migration closeup on pcb

Moisture and Material-Induced Failure Mechanisms in Power Electronics

Dr. Markus Meier, Dr. Helmut Schweigart


» free «

Corrosion on electronic and power electronic devices is one of the major effects, which negatively affect the reliability of the respective device.

ercas_fe_whitepaper_delivery: PDF


ercas_fe_whitepaper_enquire

ercas_fe_whitepaper_article_number: N/A


Corrosion on electronic and power electronic devices is one of the major effects, which negatively affect the reliability of the respective device. The ZESTRON experience from over many years of failure analysis and risk assessment in this area reveals that in power electrics especially the anodic migration phenomenon (AMP) is the corrosion mechanism most often found under high voltage conditions in combination with high humidity load.

© @The Sour Cherry Fotografie - Michaela Curtis

Dr. Markus Meier

Group Leader Reliability & Surfaces

© @The Sour Cherry Fotografie - Michaela Curtis

Dr. Helmut Schweigart

Head of Reliability & Surfaces