Ion Chromatography (IC) is a high‑resolution analytical technique used to quantitatively and qualitatively identify ionic species (anions, cations, and weak organic acids) on circuit boards and assemblies. It detects specific residue ions that may cause electrical issues such as corrosion, leakage current, or electrochemical migration.

IC testing helps manufacturers assess surface cleanliness and contamination at a detailed level, providing insights into potential failure mechanisms and enabling risk‑based process optimization to improve product quality and long‑term reliability.

Unlike simpler methods like ROSE tests that give only a total ionic contamination value, IC delivers a precise breakdown of specific ions present, helping identify the exact causes and types of contaminants on the board surface.

Ion Chromatography can be performed on bare PCBs and fully assembled PCBAs using both “full board” extraction and localized spot extraction techniques to focus on critical areas of concern.

IC testing can uncover issues such as critical ion contamination, hygroscopic ion accumulation (e.g., chloride or bromide), weak organic acids, and moisture‑induced risks — all of which can lead to field failures if left unaddressed.

The detailed ion profiles from IC testing support cleaning process evaluations, surface qualification, process troubleshooting, yield improvement, and reliability verification prior to coating, bonding, or critical assembly steps.