Basic Analysis Surface Cleanliness
Analytical servicesBasic Analysis Surface Cleanliness
The functional reliability of electronic assemblies can be significantly impaired by contamination from the production process or from the supply chain. To provide the required evidence of surface cleanliness and therefore of creeping current safety, coatability and bondability, ZESTRON developed some optical and ionic analysis methods.
When and where is a surface analysis useful?
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Evidence of surface quality for internal/external ISO audits
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Certainty in case of warranty claims in the supply chain
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Evidence of cleanliness for statistical process control
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Guarantee of coating and bonding ability of your assemblies
What does a surface analysis offer?
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Analysis in full compliance with J-STD 001 to qualify the surface cleanliness
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Optical analysis using a microscope and special test procedures
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Identification of the ionic contamination on your electronic assemblies (maximum size 350 x 250 x 80 mm / 14” x 10” x 3.1”, Minimum area 25 cm² on one side)
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This can be used to estimate the level of cleanliness of your electronic assemblies for coatability, bondability and creeping current safety
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A detailed technical report including documentation and pictures