Verification of Ionic Contamination Under Low-Standoff Components
Dr. Helmut Schweigart, Freddy Gilbert
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Brief Insight
Miniaturized components make cleanliness inspection increasingly difficult. This study shows how Ion Chromatography (IC) can ensure reliable cleanliness control in narrow standoffs and identifies key extraction parameters for accurate risk assessment.
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Article number: EN-2204-03
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Verification of Ionic Contamination Under Low-Standoff Components
Abstract
The ongoing miniaturization of electronic components reduces standoffs and complicates cleanliness inspection. While sufficient cleanliness remains crucial to ensure process stability and prevent failures, conventional ion equivalent measurement (ROSE Test) offers only rough estimations. Ion Chromatography (IC), by contrast, enables identification and quantification of ionic species, allowing a more precise risk assessment. This study investigates the influence of temperature, extraction time, and isopropanol content on ion extraction from gaps smaller than 30 μm to determine optimal parameters for reliable cleanliness control of modern assemblies.
Key Topics
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Ion chromatography - Principles
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Performing the experiment
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Results, summary & outlook
Category: Ionic Contamination / PCB Production & Analytics | Request: Bookmark this
Dr. Helmut Schweigart
Head of Reliability & Surfaces
Dr. Helmut Schweigart obtained his doctorate for research into the reliability of electronic sub-assemblies, and he has been employed at ZESTRON Europe since the early days of the company. He is now Head of Reliability & Surfaces Team. He is also a member of the Board of Management at GfKORR (Gesellschaft für Korrosionsschutz - a company specialising in corrosion inhibitors) as well as an active member of GUS (Gesellschaft für Umweltsimulation - an environmental simulation company) and of the IPC. He has already published numerous technical articles.
Freddy Gilbert
Technology Analyst
Freddy Gilbert studied material sciences at the Graduate School of engineering of the University of Montpellier and the Technical University of Berlin. In his position as Technology Analyst in the ZESTRON Reliability & Surfaces team, he organises and conducts Technology Coachings focused on failure analysis, surface analysis as well as risk assessment.