SEM/EDX Analysis

Analytical servicesSEM / EDX Analysis

The SEM/EDX method, consisting of scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX), is a powerful technique for examining the surface properties and chemical composition of various materials.
Especially in the electronics sector, SEM/EDX analyses can detect surface defects and contamination on your assemblies and identify and analyse failures at a microscopic level.

When and where is an SEM/EDX analysis useful?

• Cleanliness analysis before and after cleaning

• Particle analysis for technical cleanliness VDA 19 / ISO 16232

• Coating Layer thickness measurement of metal finishes

• Identification of organic and inorganic compounds

• Roughness analysis of surfaces

• Damage analysis & failure analysis e.g. corrosion, adhesion problems, joining problems, metallisation, surface analysis, as well as composition and distribution of residues and particles

What does an SEM/EDX analysis offer?

• Field emission technology enables near-surface imaging at low acceleration voltages

• High-resolution visualization of the topography of your samples

• Precise analysis of the chemical elements of materials and components

• Display of material contrast and density on the surface

• Depending on the task and the evaluation of our analysts, different detectors are used

• Performing stitching as needed

• We provide comprehensive evaluations upon request in a PowerPoint presentation or a technical report including interpretation